JDR -- Index by Author (Sep 2005; Volume 84, Number 9)

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Index by Author: Sep 2005; 84 (9) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Ando, S. [Abstract] [Full Text]; Arai, H. [Abstract] [Full Text]
B: Barbour, S.E. [Abstract] [Full Text]; Bartlett, J.D. [Abstract] [Full Text]; Beniash, E. [Abstract] [Full Text]; Björkman, L. [Abstract] [Full Text]; Bowman, C.N. [Abstract] [Full Text]
C: Caufield, P.W. [Abstract] [Full Text]; Choi, S.-Y. [Abstract] [Full Text]
D: Dasanayake, A.P. [Abstract] [Full Text]; Douglass, C.W. [Abstract] [Full Text]; Dwyer, S.E. [Abstract] [Full Text]
F: Fang, Z. [Abstract] [Full Text]; Feine, J.S. [Abstract] [Full Text]
H: Heydecke, G. [Abstract] [Full Text]
I: Iizuka, T. [Abstract] [Full Text]
K: Kawabata, T. [Abstract] [Full Text]; Kikuchi, T. [Abstract] [Full Text]; Kim, H.J. [Abstract] [Full Text]; Kim, J.S. [Abstract] [Full Text]; Kim, M.S. [Abstract] [Full Text]; Koolstra, J.H. [Abstract] [Full Text]; Koolstra, J.H. [Abstract] [Full Text]; Korfage, J.A.M [Abstract] [Full Text]; Korfage, J.A.M [Abstract] [Full Text]; Kosugi, S. [Abstract] [Full Text]
L: Lam, K.F. [Abstract] [Full Text]; Langenbach, G.E.J. [Abstract] [Full Text]; Langenbach, G.E.J. [Abstract] [Full Text]; Lee, J.-H. [Abstract] [Full Text]; Lee, M.H. [Abstract] [Full Text]; Lee, S. [Abstract] [Full Text]; Lee, S.J. [Abstract] [Full Text]; Lee, S.J. [Abstract] [Full Text]; Li, H.-Y. [Abstract] [Full Text]; Li, Y. [Abstract] [Full Text]; Liu, M. [Abstract] [Full Text]; Lo, E.C.M. [Abstract] [Full Text]; Lu, H. [Abstract] [Full Text]; Lund, J.P. [Abstract] [Full Text]
M: Miyazaki, Takashi [Abstract] [Full Text]; Mucci, L.A. [Abstract] [Full Text]; Murakami, K. [Abstract] [Full Text]; Murashima-Suginami, A. [Abstract] [Full Text]; Myokai, F. [Abstract] [Full Text]
N: Nishida, M. [Abstract] [Full Text]; Nishimura, F. [Abstract] [Full Text]
O: Odgren, P.R. [Abstract] [Full Text]; Oh, S.B. [Abstract] [Full Text]; Ohira, T. [Abstract] [Full Text]; Oyama, M. [Abstract] [Full Text]
P: Pan, F. [Abstract] [Full Text]; Park, C.-K. [Abstract] [Full Text]; Park, C.J. [Abstract] [Full Text]; Park, K. [Abstract] [Full Text]; Park, S.A. [Abstract] [Full Text]; Payne-Ferreira, T.L. [Abstract] [Full Text]; Pedersen, N.L. [Abstract] [Full Text]; Penrod, J.R. [Abstract] [Full Text]; Purkall, D.B. [Abstract] [Full Text]
S: Sato, T. [Abstract] [Full Text]; Schenkein, H.A. [Abstract] [Full Text]; Shibata, Y. [Abstract] [Full Text]; Shimizu, A. [Abstract] [Full Text]; Shiomi, N. [Abstract] [Full Text]; Skobe, Z. [Abstract] [Full Text]; Stansbury, J.W. [Abstract] [Full Text]; Sugai, M. [Abstract] [Full Text]; Sukumar, S. [Abstract] [Full Text]
T: Takahashi, K. [Abstract] [Full Text]; Takanashi, Y. [Abstract] [Full Text]; Takashiba, S. [Abstract] [Full Text]; Tew, J.G. [Abstract] [Full Text]; Thomason, J.M. [Abstract] [Full Text]
V: van Eijden, T.M.G.J. [Abstract] [Full Text]; van Eijden, T.M.G.J. [Abstract] [Full Text]; Vermund, S.H. [Abstract] [Full Text]
W: Wiener, H.W. [Abstract] [Full Text]; Willis, D.L. [Abstract] [Full Text]; Wise, G.E. [Abstract] [Full Text]; Wong, M.C.M. [Abstract] [Full Text]
Y: Yamamoto, H. [Abstract] [Full Text]; Yamashiro, K. [Abstract] [Full Text]; Yao, S. [Abstract] [Full Text]; Yeon, K.-Y. [Abstract] [Full Text]; Yoon, T.G. [Abstract] [Full Text]; Yum, K.W. [Abstract] [Full Text]

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