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Figure 2. Surface characterizations of the Ti-Cl. (A) An XRD peak of TiCl3 is detected on Ti-Cl, while the peak of the TiO suboxide layer is increased on Ti-Cl. XRD was operated at 40 kV, 40 mA with a scanning speed of 0.02°/4 sec and a scanning range of 20-50° with CuK
radiation. XPS high-resolution spectra of O1s on Ti-Cl before immersion (B) and after 1 hr of immersion in pure distilled water (C). A 20-mA emission current and 8-kV accelerated voltage were applied in the XPS analysis with MgK radiation. The three peaks of the curve fit of the O1s spectra on Ti-Cl are shown. Peak 1 was set at 530.1 eV at TiO2, peak 2 at 531.1 eV for H2O, and peak 3 at 532.3 eV for Ti-OH. The peak 3 indicating Ti-OH increased (p < 0.01) on the surface of Ti-Cl after immersion (C). The results of the XPS data are expressed as the mean ± SD of 6 specimens (n = 6). The findings were analyzed statistically by Student’s t tests. Significant differences are considered to exist when p < 0.01.
