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Journal of Dental Research, Vol 62, 933-936, Copyright © 1983 by International & American Associations for Dental Research Online Journals

ARTICLES

An x-ray spectrometric technique for measuring porcelain-metal adherence

R. D. Ringle, J. R. Mackert Jr and C. W. Fairhurst

This study demonstrated a correlation between silicon x-ray counts and area fractions of adherent porcelain as determined by point-counting. This correlation has allowed a method to be devised for measuring area fractions of porcelain adherent to porcelain-fused-to-metal (PFM) fracture surfaces. The described method, after controlled destruction of the porcelain mass, uses silicon x-rays excited by the electron beam in a scanning electron microscope. Under the conditions employed in these studies, the x-ray technique has shown that this gold alloy retains more porcelain than does either of two particular nickel-chromium alloys.




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