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Journal of Dental Research, Vol 57, 296-305, Copyright © 1978 by International & American Associations for Dental Research Online Journals
ARTICLES |
D. M. Hercules and N. L. Craig
ESCA has been combined with argon-ion etching to obtain depth profiles for SnF2-treated enamel. Three zones of products from the topical treatment are detected: a layer of tin oxide on the surface; fluoroapatite + hydroxyapatite at depths below about 0.2 micron; an intermediate layer CaF2, Sn(OH)2, Sn2PO4OH, and fluoroapatite between the two. Sn3F3PO4 was not detected.
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