Phase Discrimination Using Scanning Electron Microscopy Techniques
LEONARD N. JOHNSON 1
1 Department of Restorative Dentisty, Division of Dental Materials Science, Faculty of Dentistry, University of Western Ontario, London, Ontario, Canada
Polished, unetched amalgam surfaces were studied metallographically with a scanning electron microscope (SEM). By use of different modes of SEM operation, micrographs were obtained from variations in the electric properties of the respective phases present. This technique minimizes artifact formation that may result from conventional electric or chemical etching techniques.
Submitted on April 15, 1971
