Scanning Electron Microscopy of Cut Tooth Surfaces and Identification of Debris by Use of the Electron Microprobe

¹ School of Dentistry, State University of New York at Buffalo, Buffalo, New York 14214, USA and Applied Research Laboratories, Sunland, California 91040, USA

The electron microprobe with scanning electron microscope attachment was used to characterize the topographic appearance of cut tooth surfaces and to identify the remaining debris chemically. Tooth debris and organic films were present on all cut surfaces. The surfaces appeared rough, and a smeared layer was observed at high magnifications.